The tip then reacts to electric fields near the surface and allows them to be mapped on the nanometer scale. EFM: Similar to MFM but an electrical charge is applied to the tip.Electrical Techniques Involving Long Range Forces:.The tip reacts to magnetic forces near the sample allowing mapping of magnetic domains on the nanometer scale. MFM: In this a magnetized or magnetically sensitive tip is used for the lift mode image.During this second trace, the response of the tip to long-range forces such as magnetic or electrical forces is measured and an image is generated based on these measurements. Lift Mode for Measuring Long Range Forces: Most electrical and magnetic force work is done using “Lift Mode.” The tip first scans each like of the surface, then repeats the motion over that line, following the trace a preset distance above the surface.Techniques Involving Long Range Forces:.Allows mapping of surface stiffness and adhesion. Force Volume Imaging: While being scanned over the surface, the tip is pressed into the surface at each point and the response of the tip measured.this twist corresponds to the sideways force on the tip from factors like surface slope and coefficients of friction between the surface and the tip. Lateral Force/Friction Imaging: Done in contact mode, friction imaging measures the twist of the probe as it is scanned across the surface.Material Distributions and Chemical Domains in Polymer Blends and Copolymers.Phase images can provide important information on a variety of characteristics of the sample at the micron to nanometer scale. Phase images are sensitive to stiffness and adhesion (stickiness) of the surface as well as edges and boundaries.
Phase Imaging: Done in tapping mode, phase imaging allows mapping of material domains on the surface.Surface Morphology Measurement: Feature size and shape.
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